Via iTEM Diffraction, diffraction patterns (SAED) of both single crystalline and polycrystalline samples can be indexed. After the crystal structure and lattice parameters have been defined, indexing is conducted via threshold detection (automatically) or via definition of the two g vectors (manually). Alongside the Miller indices, the zone axis is shown as the indexing result within the image overlay. The related lattice distances may be listed in a sheet automatically as needed. All data, including the image information is saved with the diffraction image.

The Diffraction iTEM Solution offers easy analysis of diffraction patterns. Lattice plane distances are simple to measure as well as the angles between two different planes. The integrated snap function - which can be switched on and off - ensures the greatest possible precision. The snap function locates the brightest ambient point automatically and then uses this as a point of measurement.

* iTEM Software